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ANSELA bảng dữ liệu(PDF) 121 Page - Microchip Technology

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Giải thích chi tiết về linh kiện  Digitally Enhanced Power Analog Controller with Integrated Synchronous Driver
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ANSELA bảng dữ liệu(HTML) 121 Page - Microchip Technology

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DS22331A-page 121
MCP19111
21.0
INTERNAL TEMPERATURE
INDICATOR MODULE
The MCP19111 is equipped with a temperature circuit
designed to measure the operating temperature of the
silicon die. The circuit's range of the operating
temperature falls between -40°C and +125°C. The
output is a voltage that is proportional to the device
temperature. The output of the temperature indicator is
internally connected to the device ADC.
21.1
Circuit Operation
The
TMPSEN
bit
in
the
ABECON
register,
Register 6-15, is set to enable the internal temperature
measurement circuit. The MCP19111 overtemperature
shutdown feature is NOT controlled by this bit.
FIGURE 21-1:
TEMPERATURE CIRCUIT
DIAGRAM
21.2
Temperature Output
The output of the circuit is measured using the internal
analog-to-digital converter. Channel 10 is reserved for
the temperature circuit output. Refer to Section 22.0
“Analog-to-Digital Converter (ADC) Module” for
detailed information.
The temperature of the silicon die can be calculated by
the ADC measurement by using Equation 21-1.
EQUATION 21-1:
SILICON DIE
TEMPERATURE
TSEN
ADC
MUX
TSRNG
VDD
ADC
CHS bits
(ADCON0 register)
n
VOUT
TEMP_DIE
ADC READING
1.75
–
13.3mV/
C
-----------------------------------------------------------
=



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