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STM32L4P5CEU6TR bảng dữ liệu(PDF) 199 Page - STMicroelectronics

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Giải thích chi tiết về linh kiện  Ultra-low-power Arm® Cortex®-M4 32-bit MCUFPU, 150 DMIPS, up to 1-MB Flash memory, 320-KB SRAM, LCD-TFT, ext. SMPS
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STM32L4P5CEU6TR bảng dữ liệu(HTML) 199 Page - STMicroelectronics

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DS12903 Rev 2
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STM32L4P5xx
Electrical characteristics
277
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 67. EMI characteristics
Symbol Parameter
Conditions
Monitored frequency
band
Max vs. [fHSE/fHCLK]
Unit
8 MHz/120 MHz
SEMI
Peak level
Vdd=3.6 V, TA =25°C,
LQFP144 package,
conforming to IEC61967-2
0.1 MHz to 30 MHz
16
dBμV
30 MHz to 130 MHz
16
130 MHz to 1 GHz
19
1 GHz to 2 GHz
12
EMI Level
3.5
-



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