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STM32MP151A bảng dữ liệu(PDF) 185 Page - STMicroelectronics

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DS12500 Rev 1
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STM32MP151A
Electrical characteristics
228
6.3.19
QUADSPI interface characteristics
Unless otherwise specified, the parameters given in Table 68 and Table 69 for QUADSPI
are derived from tests performed under the ambient temperature, Faxiss_ck frequency and
VDD supply voltage conditions summarized in Table 13: General operating conditions, with
the following configuration:
Output speed is set to OSPEEDRy[1:0] = 11
Measurement points are done at CMOS levels: 0.5×VDD
I/O compensation cell enabled
HSLV activated when VDD ≤ 2.7 V
Refer to Section 0.3.16: I/O port characteristics for more details on the input/output alternate
function characteristics.
Table 67. Switching characteristics for NAND Flash write cycles(1)
Symbol
Parameter
Min
Max
Unit
tw(NWE)
FMC_NWE low width
4Tfmc_ker_ck-1
4Tfmc_ker_ck+1
ns
tv(NWE-D)
FMC_NWE low to FMC_D[15-0] valid
0
-
th(NWE-D)
FMC_NWE high to FMC_D[15-0] invalid
3Tfmc_ker_ck
-
td(D-NWE)
FMC_D[15-0] valid before FMC_NWE high
4Tfmc_ker_ck-3
-
td(ALE-NWE)
FMC_ALE valid before FMC_NWE low
-
2Tfmc_ker_ck+1
th(NWE-ALE)
FMC_NWE high to FMC_ALE invalid
3Tfmc_ker_ck+0.5
-
1. Guaranteed by characterization results.
Table 68. QUADSPI characteristics in SDR mode
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Fck1/t(CLK)
QUADSPI clock frequency
2.7 V ≤ VDD < 3.6 V
CL = 20 pF
-
-
166
MHz
1.71 V < VDD <3.6 V
CL = 15 pF
--
90
tw(CLKH)
QUADSPI clock high and low
time
-
t(CLK)/2 - 0.5
-
t(CLK)/2 + 0.5
ns
tw(CLKL)
t(CLK)/2 - 0.5
-
t(CLK)/2 + 0.5
ts(IN)
Data input setup time
-
1.25
-
-
th(IN)
Data input hold time
-
2.75
-
-
tv(OUT)
Data output valid time
-
-
1
1.5
th(OUT)
Data output hold time
-
0
-
-



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