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STM32H563AI bảng dữ liệu(PDF) 160 Page - STMicroelectronics |
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STM32H563AI bảng dữ liệu(HTML) 160 Page - STMicroelectronics |
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160 / 270 page ![]() Electrical characteristics STM32H562xx and STM32H563xx 160/270 DS14258 Rev 5 limit (higher than 5 LSB TUE), out of conventional limits (-5 / +0 µA range) of induced leakage current on adjacent pins, or other functional failures (such as reset, oscillator frequency deviation). The following table shows I/Os current injection susceptibility data. Negative/positive induced leakage currents are caused, respectively, by negative/positive injection. 5.3.15 I/O port characteristics General input/output characteristics Unless otherwise specified, the parameters given in Table 58 are derived from tests performed under the conditions summarized in Table 20. All I/Os are CMOS and TTL compliant (except for BOOT0). Note: For information on GPIO configuration, refer to AN4899 “STM32 GPIO configuration for hardware settings and low-power consumption”, available on www.st.com. Table 57. I/O current injection susceptibility(1) 1. Evaluated by characterization - Not tested in production. Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on pins PA4, PA5, PB2, PB12, PC14, PC15, PD8, and PH2 00 mA Injected current on all other pins 5 N/A Table 58. I/O static characteristics(1) Symbol Parameter Conditions Min Typ Max Unit VIL I/O input low level voltage except BOOT0 1.08 V < VDD < 3.6 V - - 0.3 VDDIOx(2) V I/O input low level voltage except BOOT0 - - 0.4 VDDIOx - 0.1(3) BOOT0 I/O input low level voltage -- 0.19 VDDIOx + 0.1(3) VIH I/O input high level voltage except BOOT0 1.08 V < VDD < 3.6 V 0.7 VDDIOx(2) -- V I/O input high level voltage except BOOT0 0.52 VDDIOx + 0.18(3) -- BOOT0 I/O input high level voltage 0.17 VDDIOx + 0.6(3) -- VHYS(3) TT_xx, FT_xxx and NRST I/O input hysteresis 1.08 V < VDD < 3.6 V - 250 - mV BOOT0 I/O input hysteresis 1.71 V < VDD < 3.6 V - 200 - |
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