PC312XDP512F0CFVR datasheet(1262/1350 Pages) FREESCALE

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Appendix A Electrical Characteristics

MC9S12XDP512 Data Sheet, Rev. 2.17

1262

Freescale Semiconductor

A.3.2

NVM Reliability

The reliability of the NVM blocks is guaranteed by stress test during qualiﬁcation, constant process

monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is

incremented every time a sector or mass erase event is executed

Table A-18. NVM Reliability Characteristics1

1 T

Javg will not exeed 85°C considering a typical temperature proﬁle over the lifetime of a consumer, industrial or automotive

application.

Conditions are shown in Table A-4 unless otherwise noted

Num

Rating

Symbol

Min

Typ

Max

Unit

Flash Reliability Characteristics

C Data retention after 10,000 program/erase cycles at an

average junction temperature of TJavg

≤ 85°C

tFLRET

1002

2 Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to

°C using the Arrhenius equation. For additional information on how Freescale deﬁnes Typical Data Retention, please refer

to Engineering Bulletin EB618.

—

Years

C Data retention with <100 program/erase cycles at an

average junction temperature TJavg

≤ 85°C

1002

—

C Number of program/erase cycles

(–40

°C

≤ T

≤ 0°C)

nFL

10,000

—

Cycles

C Number of program/erase cycles

°C

≤ T

≤ 140°C)

10,000

100,0003

3 Spec table quotes typical endurance evaluated at 25°C for this product family, typical endurance at various temperature can

be estimated using the graph below. For additional information on how Freescale deﬁnes Typical Endurance, please refer to

Engineering Bulletin EB619.

—

EEPROM Reliability Characteristics

C Data retention after up to 100,000 program/erase cycles

at an average junction temperature of TJavg

≤ 85°C

tEEPRET

1002

—

Years

C Data retention with <100 program/erase cycles at an

average junction temperature TJavg

≤ 85°C

1002

—

C Number of program/erase cycles

(–40

°C

≤ T

≤ 0°C)

nEEP

10,000

—

Cycles

C Number of program/erase cycles

°C < TJ

≤ 140°C)

100,000

300,0003

—

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